{"title":"热波在显微无损检测中的应用","authors":"J. Jaarinen, R. Rajala, T. Tiusanen, M. Luukkala","doi":"10.1109/T-SU.1985.31605","DOIUrl":null,"url":null,"abstract":"Abstmct-The thermal waves that are generated in connection with the photoacoustic and photothermal effect can be used to probe microscopic features of various solid-state samples. Even relatively low frequency thermal waves can be useful for nondestructive testing.","PeriodicalId":371797,"journal":{"name":"IEEE Transactions on Sonics and Ultrasonics","volume":"5 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1985-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Use of Thermal Waves for Microscopic NDT Purposes\",\"authors\":\"J. Jaarinen, R. Rajala, T. Tiusanen, M. Luukkala\",\"doi\":\"10.1109/T-SU.1985.31605\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Abstmct-The thermal waves that are generated in connection with the photoacoustic and photothermal effect can be used to probe microscopic features of various solid-state samples. Even relatively low frequency thermal waves can be useful for nondestructive testing.\",\"PeriodicalId\":371797,\"journal\":{\"name\":\"IEEE Transactions on Sonics and Ultrasonics\",\"volume\":\"5 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1985-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Sonics and Ultrasonics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/T-SU.1985.31605\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Sonics and Ultrasonics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/T-SU.1985.31605","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Abstmct-The thermal waves that are generated in connection with the photoacoustic and photothermal effect can be used to probe microscopic features of various solid-state samples. Even relatively low frequency thermal waves can be useful for nondestructive testing.
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