软错误和能耗交互:数据缓存透视图

Lin Li, V. Degalahal, N. Vijaykrishnan, M. Kandemir, M. J. Irwin
{"title":"软错误和能耗交互:数据缓存透视图","authors":"Lin Li, V. Degalahal, N. Vijaykrishnan, M. Kandemir, M. J. Irwin","doi":"10.1145/1013235.1013273","DOIUrl":null,"url":null,"abstract":"Energy-efficiency and reliability are two major design constraints influencing next generation system designs. In this work, we focus on the interaction between power consumption and reliability considering the on-chip data caches. First, we investigate the impact of two commonly used architectural-level leakage reduction approaches on the data reliability. Our results indicate that the leakage optimization techniques can have very different reliability behavior as compared to an original cache with no leakage optimizations. Next, we investigate on providing data reliability in an energy-efficient fashion in the presence of soft-errors. In contrast to current commercial caches that treat and protect all data using the same error detection/correction mechanism, we present an adaptive error coding scheme that treats dirty and clean data cache blocks differently. Furthermore, we present an early-write-back scheme that enhances the ability to use a less powerful error protection scheme for a longer time without sacrificing reliability. Experimental results show that proposed schemes, when used in conjunction, can reduce dynamic energy of error protection components in L1 data cache by 11% on average without impacting the performance or reliability.","PeriodicalId":120002,"journal":{"name":"Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758)","volume":null,"pages":null},"PeriodicalIF":0.0000,"publicationDate":"2004-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"138","resultStr":"{\"title\":\"Soft error and energy consumption interactions: a data cache perspective\",\"authors\":\"Lin Li, V. Degalahal, N. Vijaykrishnan, M. Kandemir, M. J. Irwin\",\"doi\":\"10.1145/1013235.1013273\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Energy-efficiency and reliability are two major design constraints influencing next generation system designs. In this work, we focus on the interaction between power consumption and reliability considering the on-chip data caches. First, we investigate the impact of two commonly used architectural-level leakage reduction approaches on the data reliability. Our results indicate that the leakage optimization techniques can have very different reliability behavior as compared to an original cache with no leakage optimizations. Next, we investigate on providing data reliability in an energy-efficient fashion in the presence of soft-errors. In contrast to current commercial caches that treat and protect all data using the same error detection/correction mechanism, we present an adaptive error coding scheme that treats dirty and clean data cache blocks differently. Furthermore, we present an early-write-back scheme that enhances the ability to use a less powerful error protection scheme for a longer time without sacrificing reliability. Experimental results show that proposed schemes, when used in conjunction, can reduce dynamic energy of error protection components in L1 data cache by 11% on average without impacting the performance or reliability.\",\"PeriodicalId\":120002,\"journal\":{\"name\":\"Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758)\",\"volume\":null,\"pages\":null},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-08-09\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"138\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/1013235.1013273\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the 2004 International Symposium on Low Power Electronics and Design (IEEE Cat. No.04TH8758)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/1013235.1013273","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 138

摘要

能源效率和可靠性是影响下一代系统设计的两个主要设计约束。在这项工作中,我们将重点放在考虑片上数据缓存的功耗和可靠性之间的相互作用上。首先,我们研究了两种常用的架构级泄漏减少方法对数据可靠性的影响。我们的结果表明,与没有泄漏优化的原始缓存相比,泄漏优化技术可能具有非常不同的可靠性行为。接下来,我们将研究如何在存在软错误的情况下以节能的方式提供数据可靠性。与目前使用相同错误检测/纠正机制处理和保护所有数据的商业缓存不同,我们提出了一种自适应错误编码方案,以不同的方式处理脏数据和干净数据缓存块。此外,我们提出了一种早期回写方案,该方案增强了在不牺牲可靠性的情况下长时间使用较弱的错误保护方案的能力。实验结果表明,在不影响性能和可靠性的情况下,所提出的方案可以将L1数据缓存中错误保护组件的动态能量平均降低11%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Soft error and energy consumption interactions: a data cache perspective
Energy-efficiency and reliability are two major design constraints influencing next generation system designs. In this work, we focus on the interaction between power consumption and reliability considering the on-chip data caches. First, we investigate the impact of two commonly used architectural-level leakage reduction approaches on the data reliability. Our results indicate that the leakage optimization techniques can have very different reliability behavior as compared to an original cache with no leakage optimizations. Next, we investigate on providing data reliability in an energy-efficient fashion in the presence of soft-errors. In contrast to current commercial caches that treat and protect all data using the same error detection/correction mechanism, we present an adaptive error coding scheme that treats dirty and clean data cache blocks differently. Furthermore, we present an early-write-back scheme that enhances the ability to use a less powerful error protection scheme for a longer time without sacrificing reliability. Experimental results show that proposed schemes, when used in conjunction, can reduce dynamic energy of error protection components in L1 data cache by 11% on average without impacting the performance or reliability.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
Mitigating inductive noise in SMT processors Balanced energy optimization Managing standby and active mode leakage power in deep sub-micron design Subthreshold leakage power distribution considering within-die and die-to-die P-T-V variations FSM-based power modeling of wireless protocols: the case of Bluetooth
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1