Seong-Jin Kim, Byongmin Kang, James D. K. Kim, KeeChang Lee, Chang-Yeong Kim, Kinam Kim
{"title":"一个1920×1080 3.65μm像素2D/3D图像传感器,在0.11pm标准CMOS上具有拆分和分组像素结构","authors":"Seong-Jin Kim, Byongmin Kang, James D. K. Kim, KeeChang Lee, Chang-Yeong Kim, Kinam Kim","doi":"10.1109/ISSCC.2012.6177063","DOIUrl":null,"url":null,"abstract":"In this paper, we present a 2nd-generation 2D/3D imager based on the pinned- photodiode pixel structure. The time-division readout architecture for both image types (color and depth) is maintained. A complete redesign of the imager makes pixels smaller and more sensitive than before. To obtain reliable depth information using a pinned-photodiode, a depth pixel is split into eight small pieces for high-speed charge transfer, and demodulated electrons are merged into one large storage node, enabling phase delay measurement with 52.8% demodulation contrast at 20MHz frequency. Furthermore, each split pixel gener- ates its own color information, offering a 2D image with full-HD resolution (1920x1080).","PeriodicalId":255282,"journal":{"name":"2012 IEEE International Solid-State Circuits Conference","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"37","resultStr":"{\"title\":\"A 1920×1080 3.65μm-pixel 2D/3D image sensor with split and binning pixel structure in 0.11pm standard CMOS\",\"authors\":\"Seong-Jin Kim, Byongmin Kang, James D. K. Kim, KeeChang Lee, Chang-Yeong Kim, Kinam Kim\",\"doi\":\"10.1109/ISSCC.2012.6177063\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we present a 2nd-generation 2D/3D imager based on the pinned- photodiode pixel structure. The time-division readout architecture for both image types (color and depth) is maintained. A complete redesign of the imager makes pixels smaller and more sensitive than before. To obtain reliable depth information using a pinned-photodiode, a depth pixel is split into eight small pieces for high-speed charge transfer, and demodulated electrons are merged into one large storage node, enabling phase delay measurement with 52.8% demodulation contrast at 20MHz frequency. Furthermore, each split pixel gener- ates its own color information, offering a 2D image with full-HD resolution (1920x1080).\",\"PeriodicalId\":255282,\"journal\":{\"name\":\"2012 IEEE International Solid-State Circuits Conference\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-04-03\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"37\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2012 IEEE International Solid-State Circuits Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISSCC.2012.6177063\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2012 IEEE International Solid-State Circuits Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISSCC.2012.6177063","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A 1920×1080 3.65μm-pixel 2D/3D image sensor with split and binning pixel structure in 0.11pm standard CMOS
In this paper, we present a 2nd-generation 2D/3D imager based on the pinned- photodiode pixel structure. The time-division readout architecture for both image types (color and depth) is maintained. A complete redesign of the imager makes pixels smaller and more sensitive than before. To obtain reliable depth information using a pinned-photodiode, a depth pixel is split into eight small pieces for high-speed charge transfer, and demodulated electrons are merged into one large storage node, enabling phase delay measurement with 52.8% demodulation contrast at 20MHz frequency. Furthermore, each split pixel gener- ates its own color information, offering a 2D image with full-HD resolution (1920x1080).