352.2 MHz大功率射频测试装置的研制

M. K. Badapanda, A. Tripathi, R. Upadhyay, P. R. Hannurkar
{"title":"352.2 MHz大功率射频测试装置的研制","authors":"M. K. Badapanda, A. Tripathi, R. Upadhyay, P. R. Hannurkar","doi":"10.1109/IVEC.2011.5747087","DOIUrl":null,"url":null,"abstract":"The paper presents the detail of TH 2089 klystron amplifier based high power 352.2 MHz RF test setup. This test setup has got both CW and pulsed capability. Brief description of various power supplies required for biasing this klystron amplifier, along with their interconnection and sequence of operation is also presented in this paper.","PeriodicalId":106174,"journal":{"name":"2011 IEEE International Vacuum Electronics Conference (IVEC)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Development of 352.2 MHz high power RF test setup\",\"authors\":\"M. K. Badapanda, A. Tripathi, R. Upadhyay, P. R. Hannurkar\",\"doi\":\"10.1109/IVEC.2011.5747087\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The paper presents the detail of TH 2089 klystron amplifier based high power 352.2 MHz RF test setup. This test setup has got both CW and pulsed capability. Brief description of various power supplies required for biasing this klystron amplifier, along with their interconnection and sequence of operation is also presented in this paper.\",\"PeriodicalId\":106174,\"journal\":{\"name\":\"2011 IEEE International Vacuum Electronics Conference (IVEC)\",\"volume\":\"58 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-02-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 IEEE International Vacuum Electronics Conference (IVEC)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVEC.2011.5747087\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 IEEE International Vacuum Electronics Conference (IVEC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVEC.2011.5747087","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

摘要

介绍了基于大功率352.2 MHz射频测试装置的TH 2089速调管放大器的详细设计。该试验装置具有连续波和脉冲两种性能。本文还简要介绍了偏置速调管放大器所需的各种电源,以及它们的互连和操作顺序。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
Development of 352.2 MHz high power RF test setup
The paper presents the detail of TH 2089 klystron amplifier based high power 352.2 MHz RF test setup. This test setup has got both CW and pulsed capability. Brief description of various power supplies required for biasing this klystron amplifier, along with their interconnection and sequence of operation is also presented in this paper.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
The problem of diagnostics of electronics and plasma units Cathode manufacturing relational data collection and process control system On power consumption reduction in 700 GHz BWO Design of an ka-band mode converter Heat transfer integration with Beam Optics Analyzer
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1