{"title":"半导体衬底上微带线的分析","authors":"M. Aubourg, J. Villotte, F. Codon, Y. Garault","doi":"10.1109/MWSYM.1981.1129974","DOIUrl":null,"url":null,"abstract":"A two dimensional analysis of MIS (or Schottky contact) microstrip is made with the aid of the finite element method. Theoretical results are compared with experimental results.","PeriodicalId":120372,"journal":{"name":"1981 IEEE MTT-S International Microwave Symposium Digest","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1981-06-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":"{\"title\":\"Analysis of Microstrrip Line on Semiconductor Substrate\",\"authors\":\"M. Aubourg, J. Villotte, F. Codon, Y. Garault\",\"doi\":\"10.1109/MWSYM.1981.1129974\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A two dimensional analysis of MIS (or Schottky contact) microstrip is made with the aid of the finite element method. Theoretical results are compared with experimental results.\",\"PeriodicalId\":120372,\"journal\":{\"name\":\"1981 IEEE MTT-S International Microwave Symposium Digest\",\"volume\":\"20 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1981-06-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"2\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"1981 IEEE MTT-S International Microwave Symposium Digest\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/MWSYM.1981.1129974\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"1981 IEEE MTT-S International Microwave Symposium Digest","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/MWSYM.1981.1129974","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Analysis of Microstrrip Line on Semiconductor Substrate
A two dimensional analysis of MIS (or Schottky contact) microstrip is made with the aid of the finite element method. Theoretical results are compared with experimental results.
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