遗留ATE系统的维护挑战和方法

J. Semancik
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引用次数: 0

摘要

生命周期管理是许多测试工程师存在的祸根。由于需要保持已部署的自动测试设备(ATE)的运行,过渡到下一个令人兴奋的新项目的机会可能会受到阻碍,特别是当这些系统不断超出其最初的使用寿命预期时。可以公平地假设,随着这些系统的使用寿命不断延长,硬件组件将出现故障,更换仪器和切换替代方案将不容易获得。由于大多数OEM供应商缺乏可用的传统支持,这进一步加剧了这种情况,迫使用户考虑替代方法。存在许多替代方案来解决硬件替换问题,但每种替代方案都可能带来必须考虑的实现挑战和缺点。任何维护决策中固有的风险是,不可预见的变更会使当前解决方案无效,并影响先前合格的测试程序集(tps)。用“精确的”形式、匹配、功能(FFF)替换仪器或开交换机等看似无害的事情,可能需要比预期更多的集成时间,因为硬件和软件的时间和执行速度、稳定时间和传播延迟、驱动程序实现和仪器设置/执行速度的增加或延迟等方面存在细微差异。还必须考虑这些维持活动的经济效益,并与受影响的ATE系统的预计未来负载需求进行权衡。例如,什么时候简单地购买上次购买的数量,而不是参与工程活动来实现替代解决方案?本文将深入研究测试工程师在保持遗留ATE运行时面临的这些和其他维护挑战。讨论将包括替代方法,如替换FFF下降,基于FPGA的等效仪器,架构和软件考虑,这些变化可能对现有tps产生的影响,以及各种方法的潜在预算影响。
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Sustainment Challenges and Approaches for Legacy ATE Systems
Lifecycle management is the bane of existence for many test engineers. Opportunities to transition to that next new exciting project can be hampered by the need to keep deployed automatic test equipment (ATE) operational, especially as these systems continue to be pushed beyond their initial life projections. It is fair to assume that as the service life of these systems continues to be extended, hardware components will fail and replacement instrumentation and switching alternatives will not be readily available. This is further exacerbated by the lack of available legacy support from most OEM suppliers, compelling users to consider alternate approaches. A number of alternatives exist to address hardware replacement, but each can pose implementation challenges and drawbacks that must be considered. Inherent in any sustainment decision is the risk that unforeseen changes will occur that invalidate the current solution and impact previously qualified Test Program Sets (TPSs). Something as seemingly innocuous as substituting an instrument or switch card with an “exact” form, fit, function (FFF) replacement may require significantly more integration time than expected due to minor differences in hardware and software timing and execution speeds, settling times and propagation delays, or driver implementation and instrument setup/execution speed increases or delays, just to name a few. The economics of these sustainment activities must also be considered and weighed against the projected future loading requirements for the affected ATE system. For example, when does it make sense to simply procure last time buy quantities versus engaging in engineering activities to implement an alternate solution? This paper will delve into these and other sustainment challenges test engineers face when tasked with keeping legacy ATE operational. The discussion will include alternate approaches such as FFF drop in replacements, FPGA based equivalent instrumentation, architecture and software considerations, the impact these changes can have on existing TPSs, as well as the potential budget impact for the various approaches.
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