The Test Pattern Generation for Digital Integrated Circuits Based on CA-IA-PSO Algorithm

In order to improve the ability to get rid of partial extreme spot and the diversity of population in evolution, the immunity mechanism of IA algorithm is imported into PSO algorithm to form IA-PSO algorithm. For the purpose of raising fault rate and shortening test pattern generation time, CA algorithm is imported into IA-PSO algorithm to form CAIA-PSO algorithm. Finally, adopting single stuck-at fault and using different algorithms to the simulation experiment of test pattern generation for digital integrated circuits, the result of the experiment is that CA-IA-PSO algorithm can solve the problem of test pattern generation more practically and efficiently, especially the bigger digital integrated circuits.