Low-Cost Sequential Logic Circuit Design Considering Single Event Double-Node Upsets and Single Event Transients

As CMOS device sizes continue to scale down, radiation-related reliability issues are of ever-growing concern. Single event double node upsets (SEDUs) in sequential logic and single event transients (SETs) in combinational logic are sources of high rate radiation-induced soft errors that can affect the functionality of logic circuits. This paper presents effective circuit-level solutions for combating SEDUs/SETs in nanoscale sequential and combinational logic circuits. More specifically, we propose and evaluate low-power latch and flip-flop circuits to mitigate SEDUs and SETs. Simulations with a 22 nm PTM model reveal that the proposed circuits offer full immunity against SEDUs, can better filter SET pulses, and simultaneously reduce design overhead when compared to prior work. As a representative example, simulation-based studies show that our designs offer up to 77% improvements in delay-power-area product, and can filter out up to 58% wider SET pulses when compared to the state-of-the-art.