Jianhua Yin, Jin-quan Zhao, L. Fan, Ping Hong, Hao Zhou
{"title":"一种基于精确积分法的双端故障定位算法","authors":"Jianhua Yin, Jin-quan Zhao, L. Fan, Ping Hong, Hao Zhou","doi":"10.1109/CISP-BMEI.2016.7852854","DOIUrl":null,"url":null,"abstract":"A novel method for fault location is proposed in this paper, which is based on fault voltages and currents sampled synchronously on both ends of the fault line. This algorithm is based on precise integration. Using the synchronous measurement data at the ends of the fault line, it computes the voltage along transmission line. Then comparing two groups of voltage, it can find out the location of trouble spot. This method has the advantages of quick calculating speed and accurate calculating results. Both theoretical analysis and simulation results justify the feasibility of the algorithms above.","PeriodicalId":275095,"journal":{"name":"2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"A double-terminal fault location algorithm based on precise integration method\",\"authors\":\"Jianhua Yin, Jin-quan Zhao, L. Fan, Ping Hong, Hao Zhou\",\"doi\":\"10.1109/CISP-BMEI.2016.7852854\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"A novel method for fault location is proposed in this paper, which is based on fault voltages and currents sampled synchronously on both ends of the fault line. This algorithm is based on precise integration. Using the synchronous measurement data at the ends of the fault line, it computes the voltage along transmission line. Then comparing two groups of voltage, it can find out the location of trouble spot. This method has the advantages of quick calculating speed and accurate calculating results. Both theoretical analysis and simulation results justify the feasibility of the algorithms above.\",\"PeriodicalId\":275095,\"journal\":{\"name\":\"2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI)\",\"volume\":\"102 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2016-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/CISP-BMEI.2016.7852854\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2016 9th International Congress on Image and Signal Processing, BioMedical Engineering and Informatics (CISP-BMEI)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/CISP-BMEI.2016.7852854","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
A double-terminal fault location algorithm based on precise integration method
A novel method for fault location is proposed in this paper, which is based on fault voltages and currents sampled synchronously on both ends of the fault line. This algorithm is based on precise integration. Using the synchronous measurement data at the ends of the fault line, it computes the voltage along transmission line. Then comparing two groups of voltage, it can find out the location of trouble spot. This method has the advantages of quick calculating speed and accurate calculating results. Both theoretical analysis and simulation results justify the feasibility of the algorithms above.