{"title":"场致发射过程中碳纳米管薄膜的损伤","authors":"X.H. Liang, N. Xu, Jun Chen, S. Deng","doi":"10.1109/IVNC.2005.1619618","DOIUrl":null,"url":null,"abstract":"The damage effects of emission current of different levels on the carbon nanotube (CNT) films were investigated. A critical emission current density is found, which divides the different dominative mechanisms responsible for the damage of the CNT films.","PeriodicalId":121164,"journal":{"name":"2005 International Vacuum Nanoelectronics Conference","volume":"9 41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2005-07-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Damage of carbon nanotube films during field emission\",\"authors\":\"X.H. Liang, N. Xu, Jun Chen, S. Deng\",\"doi\":\"10.1109/IVNC.2005.1619618\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The damage effects of emission current of different levels on the carbon nanotube (CNT) films were investigated. A critical emission current density is found, which divides the different dominative mechanisms responsible for the damage of the CNT films.\",\"PeriodicalId\":121164,\"journal\":{\"name\":\"2005 International Vacuum Nanoelectronics Conference\",\"volume\":\"9 41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2005-07-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2005 International Vacuum Nanoelectronics Conference\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IVNC.2005.1619618\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Vacuum Nanoelectronics Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IVNC.2005.1619618","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Damage of carbon nanotube films during field emission
The damage effects of emission current of different levels on the carbon nanotube (CNT) films were investigated. A critical emission current density is found, which divides the different dominative mechanisms responsible for the damage of the CNT films.
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