Te合金薄膜的铁电相变及其光盘性能

M. Okuda, H. Naito, T. Matsushita
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引用次数: 0

摘要

在可逆相变光学记录材料GeTe-Sb2Te3化学计量膜中,Sb的加入被广泛应用于提高结晶速度、数据保留时间和循环运行的稳定性,但其作用机理尚不清楚。V-VI化合物(GeTe, SnTe)是众所周知的发生铁电结构相变的化合物。介电常数(epsilon) 0的变化很大程度上是由于晶体中弱束缚近邻到非晶相中强束缚近邻的短程顺序的变化。因此,有必要讨论在化学计量的GeTe-Sb2Te3组成中加入Sb对结晶动力学性质和基于铁电相变的介电常数变化(Delta) (epsilon) 0的影响。
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Ferroelectric phase transition of Te alloy films and its optical disk properties
In stoichiometric GeTe-Sb2Te3 films, reversible phase change optical recording materials, Sb addition is used widely in order to improve the crystallization speed, the data retention time, and the stability of cyclic operation, but its mechanism is not clear. V-VI compounds (GeTe, SnTe) are well known as compounds in which the ferroelectric structural phase transition occurs. The dielectric constant (epsilon) 0 changes largely due to a change in the short-range order of weakly bound nearest neighbors in the crystal to more strongly bound nearest neighbors in the amorphous phase. Therefore, it is necessary to discuss the effect of Sb addition in the stoichiometric GeTe-Sb2Te3 composition upon the dynamic properties of crystallization and the dielectric constant change (Delta) (epsilon) 0 based on the ferroelectric phase transition.
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