铁掺杂Zno稀磁性半导体薄膜的制备及其磁性能研究

Yidong Zhang, Jing Liu, Yuan-hao Gao
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引用次数: 1

摘要

采用溶胶-凝胶法制备了Fe掺杂ZnO固溶体及其半导体薄膜。经时效和淬火后,采用x射线衍射(XRD)和原子力显微镜(AFM)对薄膜进行了表征。用能谱仪(EDS)测定了元素比例,用磁力显微镜(MFM)测定了磁性能。结果表明,铁掺杂可以抑制氧化锌颗粒的生长,从而提高薄膜的粗糙度。MFM结果表明,Fe掺杂可以使非磁性ZnO半导体变成稀磁性半导体。随着Fe掺杂量的增加,磁畴和磁矩的分布更加明显。
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Preparation and Magnetic Properties of Fe Doped Zno Thin Films with Dilute Magnetic Semiconductors
Fe doped ZnO solid solution and its semiconductor thin films were prepared by sol-gel method. After aging and quenching, the films were characterized by X-ray diffraction (XRD) and atomic force microscopy (AFM). The elemental proportion was obtained by energy dispersive spectrometer (EDS) and the magnetic properties were measured by magnetic force microscope (MFM). The results show that iron doping can inhibit the growth of zinc oxide particles, and then increase the roughness of thin films. The results of MFM show that Fe doping can make non-magnetic ZnO semiconductors become dilute magnetic semiconductors. With the increasing amount of Fe doping, the distribution of magnetic domains and magnetic moments becomes more obvious.
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