M. Coppedge, J. Gerring, Staffan I. Lindberg, Svend-Erik Skaaning, Jan Teorell, Frida Andersson, Kyle L. Marquardt, Valeriya Mechkova, Farhad Miri, Daniel Pemstein, Josefine Pernes, N. Stepanova, Eitan Tzelgov, Yi-ting Wang
{"title":"V-Dem方法","authors":"M. Coppedge, J. Gerring, Staffan I. Lindberg, Svend-Erik Skaaning, Jan Teorell, Frida Andersson, Kyle L. Marquardt, Valeriya Mechkova, Farhad Miri, Daniel Pemstein, Josefine Pernes, N. Stepanova, Eitan Tzelgov, Yi-ting Wang","doi":"10.2139/ssrn.2951040","DOIUrl":null,"url":null,"abstract":"Part I sets forth the V-Dem conceptual scheme. Part II discusses the process of data collection. Part III describes the measurement model along with efforts to identify and correct errors.","PeriodicalId":320844,"journal":{"name":"PSN: Econometrics","volume":"41 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"22","resultStr":"{\"title\":\"V-Dem Methodology V6\",\"authors\":\"M. Coppedge, J. Gerring, Staffan I. Lindberg, Svend-Erik Skaaning, Jan Teorell, Frida Andersson, Kyle L. Marquardt, Valeriya Mechkova, Farhad Miri, Daniel Pemstein, Josefine Pernes, N. Stepanova, Eitan Tzelgov, Yi-ting Wang\",\"doi\":\"10.2139/ssrn.2951040\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Part I sets forth the V-Dem conceptual scheme. Part II discusses the process of data collection. Part III describes the measurement model along with efforts to identify and correct errors.\",\"PeriodicalId\":320844,\"journal\":{\"name\":\"PSN: Econometrics\",\"volume\":\"41 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"22\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"PSN: Econometrics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2139/ssrn.2951040\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"PSN: Econometrics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2139/ssrn.2951040","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Part I sets forth the V-Dem conceptual scheme. Part II discusses the process of data collection. Part III describes the measurement model along with efforts to identify and correct errors.