以牙还牙:模拟目标超晶格热管理的数据中心规模效应

Susmit Biswas, Mohit Tiwari, T. Sherwood, L. Theogarajan, F. Chong
{"title":"以牙还牙:模拟目标超晶格热管理的数据中心规模效应","authors":"Susmit Biswas, Mohit Tiwari, T. Sherwood, L. Theogarajan, F. Chong","doi":"10.1145/2000064.2000104","DOIUrl":null,"url":null,"abstract":"Local thermal hot-spots in microprocessors lead to worst-case provisioning of global cooling resources, especially in large-scale systems where cooling power can be 50~100% of IT power. Further, the efficiency of cooling solutions degrade non-linearly with supply temperature. Recent advances in active cooling techniques have shown on-chip thermoelectric coolers (TECs) to be very efficient at selectively eliminating small hot-spots. Applying current to a superlattice TEC-film that is deposited between silicon and the heat spreader results in a Peltier effect, which spreads the heat and lowers the temperature of the hot-spot significantly and improves chip reliability. In this paper, we propose that hot-spot mitigation using thermoelectric coolers can be used as a power management mechanism to allow global coolers to be provisioned for a better worst case temperature leading to substantial savings in cooling power. In order to quantify the potential power savings from using TECs in data center servers, we present a detailed power model that integrates on-chip dynamic and leakage power sources, heat diffusion through the entire chip, TEC and global cooler efficiencies, and all their mutual interactions. Our multi-scale analysis shows that, for a typical data center, TECs allow global coolers to operate at higher temperatures without degrading chip lifetime, and thus save ~27% cooling power on average while providing the same processor reliability as a data center running at 288K.","PeriodicalId":340732,"journal":{"name":"2011 38th Annual International Symposium on Computer Architecture (ISCA)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"42","resultStr":"{\"title\":\"Fighting fire with fire: Modeling the datacenter-scale effects of targeted superlattice thermal management\",\"authors\":\"Susmit Biswas, Mohit Tiwari, T. Sherwood, L. Theogarajan, F. Chong\",\"doi\":\"10.1145/2000064.2000104\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Local thermal hot-spots in microprocessors lead to worst-case provisioning of global cooling resources, especially in large-scale systems where cooling power can be 50~100% of IT power. Further, the efficiency of cooling solutions degrade non-linearly with supply temperature. Recent advances in active cooling techniques have shown on-chip thermoelectric coolers (TECs) to be very efficient at selectively eliminating small hot-spots. Applying current to a superlattice TEC-film that is deposited between silicon and the heat spreader results in a Peltier effect, which spreads the heat and lowers the temperature of the hot-spot significantly and improves chip reliability. In this paper, we propose that hot-spot mitigation using thermoelectric coolers can be used as a power management mechanism to allow global coolers to be provisioned for a better worst case temperature leading to substantial savings in cooling power. In order to quantify the potential power savings from using TECs in data center servers, we present a detailed power model that integrates on-chip dynamic and leakage power sources, heat diffusion through the entire chip, TEC and global cooler efficiencies, and all their mutual interactions. Our multi-scale analysis shows that, for a typical data center, TECs allow global coolers to operate at higher temperatures without degrading chip lifetime, and thus save ~27% cooling power on average while providing the same processor reliability as a data center running at 288K.\",\"PeriodicalId\":340732,\"journal\":{\"name\":\"2011 38th Annual International Symposium on Computer Architecture (ISCA)\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2011-06-04\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"42\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2011 38th Annual International Symposium on Computer Architecture (ISCA)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/2000064.2000104\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 38th Annual International Symposium on Computer Architecture (ISCA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/2000064.2000104","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 42

摘要

微处理器中的局部热热点导致全局冷却资源的最坏情况配置,特别是在冷却功率可以达到IT功率的50~100%的大型系统中。此外,冷却方案的效率随电源温度呈非线性降低。主动冷却技术的最新进展表明,片上热电冷却器(tec)在选择性消除小热点方面非常有效。将电流施加到沉积在硅和散热片之间的超晶格tec薄膜上,会产生珀尔帖效应,从而扩散热量,显著降低热点温度,提高芯片的可靠性。在本文中,我们建议使用热电冷却器来缓解热点,可以作为一种电源管理机制,允许全球冷却器提供更好的最坏情况温度,从而大幅节省冷却功率。为了量化在数据中心服务器中使用TEC的潜在节能,我们提出了一个详细的功耗模型,该模型集成了片上动态电源和泄漏电源、整个芯片的热扩散、TEC和全局冷却器效率,以及它们之间的所有相互作用。我们的多尺度分析表明,对于一个典型的数据中心,tec允许全局冷却器在更高的温度下运行而不会降低芯片寿命,因此在提供与运行在288K下的数据中心相同的处理器可靠性的同时,平均节省约27%的冷却功率。
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Fighting fire with fire: Modeling the datacenter-scale effects of targeted superlattice thermal management
Local thermal hot-spots in microprocessors lead to worst-case provisioning of global cooling resources, especially in large-scale systems where cooling power can be 50~100% of IT power. Further, the efficiency of cooling solutions degrade non-linearly with supply temperature. Recent advances in active cooling techniques have shown on-chip thermoelectric coolers (TECs) to be very efficient at selectively eliminating small hot-spots. Applying current to a superlattice TEC-film that is deposited between silicon and the heat spreader results in a Peltier effect, which spreads the heat and lowers the temperature of the hot-spot significantly and improves chip reliability. In this paper, we propose that hot-spot mitigation using thermoelectric coolers can be used as a power management mechanism to allow global coolers to be provisioned for a better worst case temperature leading to substantial savings in cooling power. In order to quantify the potential power savings from using TECs in data center servers, we present a detailed power model that integrates on-chip dynamic and leakage power sources, heat diffusion through the entire chip, TEC and global cooler efficiencies, and all their mutual interactions. Our multi-scale analysis shows that, for a typical data center, TECs allow global coolers to operate at higher temperatures without degrading chip lifetime, and thus save ~27% cooling power on average while providing the same processor reliability as a data center running at 288K.
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