电磁故障注入作为一种新的soc取证方法

Clément Gaine, D. Aboulkassimi, S. Pontié, J. Nikolovski, J. Dutertre
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引用次数: 16

摘要

智能手机拥有复杂的硬件和软件架构。访问他们的全部存储空间可以帮助解决司法调查。为了访问隐藏内容和执行敏感操作,我们提出了一种新的权限升级技术。虽然传统的取证工具主要利用软件漏洞,但它是基于硬件安全评估技术的。电磁故障注入是一种通常用于微控制器或FPGA安全表征的技术。事件解释在linux操作系统下,64位SoC上运行1.2GHz的安全功能被成功攻击。Linux认证模块使用该函数通过比较两个哈希值来验证密码的正确性。因此,这项工作构成了通过电磁故障注入实现智能手机特权升级的一步。这种方法对于解决智能手机上的法医问题很有趣。
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Electromagnetic Fault Injection as a New Forensic Approach for SoCs
Smartphones have a complex hardware and software architecture. Having access to their full memory space can help solve judicial investigations. We propose a new privilege escalation technique in order to access hidden contents and execute sensitive operations. While classical forensic tools mostly exploit software vulnerabilities, it is based on a hardware security evaluation technique. Electromagnetic fault injection is such a technique usually used for microcontrollers or FPGA security characterization. A security function running at 1.2GHz on a 64-bit SoC with a Linux-based OS was successfully attacked. The Linux authentication module uses this function to verify the password correctness by comparing two hash values. Hence, this work constitutes a step towards smartphones privilege escalation through electromagnetic fault injection. This approach is interesting for addressing forensic issues on smartphones.
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