多晶污垢面板的PID:一种基于预测的方法

{"title":"多晶污垢面板的PID:一种基于预测的方法","authors":"D. Deb, Kshitij Bhargava","doi":"10.1016/b978-0-12-823483-9.00018-8","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":307040,"journal":{"name":"Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics","volume":"49 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"PID for multicrystalline soiled panels: a forecasting-based approach\",\"authors\":\"D. Deb, Kshitij Bhargava\",\"doi\":\"10.1016/b978-0-12-823483-9.00018-8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":307040,\"journal\":{\"name\":\"Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics\",\"volume\":\"49 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/b978-0-12-823483-9.00018-8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Degradation, Mitigation, and Forecasting Approaches in Thin Film Photovoltaics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/b978-0-12-823483-9.00018-8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}