S. Sanae, Yuko Hara-Azumi, S. Yamashita, Y. Nakashima
{"title":"优于dmr的增产技术","authors":"S. Sanae, Yuko Hara-Azumi, S. Yamashita, Y. Nakashima","doi":"10.1109/FCCM.2014.21","DOIUrl":null,"url":null,"abstract":"In this work, we first study LUT optimization in PPCs for increasing their area-efficiency for yield improvement. We focus on the fact that although 22n configurations are available for an-input LUT, such full programmability is not needed, i.e., one configuration is enough for bypassing one specific fault. Then, we optimize away too rich programmability of LUTs exploiting application features in order to reduce the area cost without degrading the fault bypassability from the original PPC.","PeriodicalId":246162,"journal":{"name":"2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines","volume":"138 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-05-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Better-Than-DMR Techniques for Yield Improvement\",\"authors\":\"S. Sanae, Yuko Hara-Azumi, S. Yamashita, Y. Nakashima\",\"doi\":\"10.1109/FCCM.2014.21\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this work, we first study LUT optimization in PPCs for increasing their area-efficiency for yield improvement. We focus on the fact that although 22n configurations are available for an-input LUT, such full programmability is not needed, i.e., one configuration is enough for bypassing one specific fault. Then, we optimize away too rich programmability of LUTs exploiting application features in order to reduce the area cost without degrading the fault bypassability from the original PPC.\",\"PeriodicalId\":246162,\"journal\":{\"name\":\"2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines\",\"volume\":\"138 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-05-11\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/FCCM.2014.21\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 IEEE 22nd Annual International Symposium on Field-Programmable Custom Computing Machines","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/FCCM.2014.21","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
In this work, we first study LUT optimization in PPCs for increasing their area-efficiency for yield improvement. We focus on the fact that although 22n configurations are available for an-input LUT, such full programmability is not needed, i.e., one configuration is enough for bypassing one specific fault. Then, we optimize away too rich programmability of LUTs exploiting application features in order to reduce the area cost without degrading the fault bypassability from the original PPC.
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