用场理论和电路理论计算沿绝缘子表面的电流密度

A. El-Hag, S. Jayaram, E. Cherney
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引用次数: 4

摘要

本文提出了两种不同的硅橡胶绝缘子污面和湿面电流密度的计算方法。第一种方法基于场论方法,利用商业软件FEMLAB/spl reg/计算电流密度。计算中使用的污染层电导率分别从绝缘子表面不同区域的等效盐沉积密度(ESDD)中提取。第二种方法是基于电路理论的方法,将绝缘体表面划分为不同的部分进行电阻计算,以考虑不同的污染程度。基于ESDD测量的绝缘子表面分割计算的电流密度排名与从测量的泄漏电流中提取的排名相匹配。
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Calculation of current density along insulator surface using field and circuit theory approaches
The paper presents two different methods to compute the current density along contaminated and wet silicone rubber insulator surface. The first method, based on field theory approach, uses the commercial software FEMLAB/spl reg/ to compute the current density. The conductivity of the contamination layer used in the calculations was extracted from the measured equivalent salt deposit density (ESDD) separately for different regions of the insulator surfaces. The second method is based on the circuit theory approach, and, the insulator surface was divided into different sections for resistance calculations to account for different contamination levels. Rankings based on the calculated current densities based on segmentation of the insulator surface for ESDD measurements match with those extracted from measured leakage currents.
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