Joseph Rosen, Lior Dezialoshinski, Ehud Nahtomi, J. Shamir
{"title":"图案比例测量的数字方法","authors":"Joseph Rosen, Lior Dezialoshinski, Ehud Nahtomi, J. Shamir","doi":"10.1364/optcomp.1991.me28","DOIUrl":null,"url":null,"abstract":"Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures.","PeriodicalId":302010,"journal":{"name":"Optical Computing","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1992-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Digital Approach for Pattern Scale Measurement\",\"authors\":\"Joseph Rosen, Lior Dezialoshinski, Ehud Nahtomi, J. Shamir\",\"doi\":\"10.1364/optcomp.1991.me28\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures.\",\"PeriodicalId\":302010,\"journal\":{\"name\":\"Optical Computing\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1992-05-22\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Optical Computing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/optcomp.1991.me28\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Computing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/optcomp.1991.me28","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Pattern size measurement is important for applications such as industrial classification and ranging. Optical systems offer fast and parallel processing of detailed pictures.
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