M. Fakhruddin, Kuok-Khian Lo, J. Karp, M. Hart, Min-Hsing P. Chen
{"title":"验证方法,以保证较低的走线阻力","authors":"M. Fakhruddin, Kuok-Khian Lo, J. Karp, M. Hart, Min-Hsing P. Chen","doi":"10.1109/ISQED.2018.8357297","DOIUrl":null,"url":null,"abstract":"The proposed verification methodology enables designers to meet a maximum resistance specification for the well taps routing. Key strengths of the flow are: automatic identification of both well taps and VDD/VSS grid; comparison of the extracted resistance to a user defined specification value; review of results with a graphical interface; no marker layers to identify the extraction path.","PeriodicalId":213351,"journal":{"name":"2018 19th International Symposium on Quality Electronic Design (ISQED)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Verification methodology to guarantee low routing resistance to well taps\",\"authors\":\"M. Fakhruddin, Kuok-Khian Lo, J. Karp, M. Hart, Min-Hsing P. Chen\",\"doi\":\"10.1109/ISQED.2018.8357297\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The proposed verification methodology enables designers to meet a maximum resistance specification for the well taps routing. Key strengths of the flow are: automatic identification of both well taps and VDD/VSS grid; comparison of the extracted resistance to a user defined specification value; review of results with a graphical interface; no marker layers to identify the extraction path.\",\"PeriodicalId\":213351,\"journal\":{\"name\":\"2018 19th International Symposium on Quality Electronic Design (ISQED)\",\"volume\":\"48 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 19th International Symposium on Quality Electronic Design (ISQED)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISQED.2018.8357297\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 19th International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2018.8357297","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Verification methodology to guarantee low routing resistance to well taps
The proposed verification methodology enables designers to meet a maximum resistance specification for the well taps routing. Key strengths of the flow are: automatic identification of both well taps and VDD/VSS grid; comparison of the extracted resistance to a user defined specification value; review of results with a graphical interface; no marker layers to identify the extraction path.