{"title":"一种基于CCD线性传感器的自动游标方法","authors":"H. Wang, M. Baba, T. Konishi","doi":"10.1109/IMTC.1994.351804","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a new automatic dimension and displacement measuring method for high resolution by using the principle of vernier caliper. In this method, the main scale and the vernier scale are replaced with two different pitch CCD linear image sensors, respectively. The system detects number of the pixel at which the main scale coincides with the vernier scale and can measure in higher resolution than the original CCD pitch. Consequently, the proposed method is effective for precise dimension and displacement measurement.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"An automatic vernier scale method by CCD linear sensor\",\"authors\":\"H. Wang, M. Baba, T. Konishi\",\"doi\":\"10.1109/IMTC.1994.351804\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a new automatic dimension and displacement measuring method for high resolution by using the principle of vernier caliper. In this method, the main scale and the vernier scale are replaced with two different pitch CCD linear image sensors, respectively. The system detects number of the pixel at which the main scale coincides with the vernier scale and can measure in higher resolution than the original CCD pitch. Consequently, the proposed method is effective for precise dimension and displacement measurement.<<ETX>>\",\"PeriodicalId\":231484,\"journal\":{\"name\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"volume\":\"4 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1994.351804\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1994.351804","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
An automatic vernier scale method by CCD linear sensor
In this paper, we propose a new automatic dimension and displacement measuring method for high resolution by using the principle of vernier caliper. In this method, the main scale and the vernier scale are replaced with two different pitch CCD linear image sensors, respectively. The system detects number of the pixel at which the main scale coincides with the vernier scale and can measure in higher resolution than the original CCD pitch. Consequently, the proposed method is effective for precise dimension and displacement measurement.<>