具有潜在因素的面板数据模型中误差横截面相关性的偏差校正CD检验

M. Pesaran, Yimeng Xie
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引用次数: 11

摘要

在最近的一篇论文中,Juodis和Reese (2021) (JR)表明,将Pesaran(2004)提出的CD检验应用于具有潜在因素的面板的残差会导致过度排斥,并提出了随机检验统计量来纠正过度排斥,并添加筛选组件以实现功率。本文从不同的角度考虑了同样的问题,并表明如果潜在因素较弱,标准CD检验仍然有效,并提出了一个简单的偏差校正CD检验,标记为CD*,无论潜在因素是弱还是强,它都证明是渐近正态的。这一结果被证明适用于纯潜在因素模型以及具有潜在因素的面板回归。通过蒙特卡罗实验研究了CD*测试的小样本性质,并证明了它对于高斯和非高斯误差都具有正确的大小和令人满意的功率。相比之下,发现JR的测试在具有非高斯误差的面板的情况下倾向于过度拒绝,并且对空间网络替代品具有低功耗。CD*测试的使用说明了两个实证应用从文献。
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A Bias-Corrected CD Test for Error Cross-Sectional Dependence in Panel Data Models with Latent Factors
In a recent paper Juodis and Reese (2021) (JR) show that the application of the CD test proposed by Pesaran (2004) to residuals from panels with latent factors results in over-rejection and propose a randomized test statistic to correct for over-rejection, and add a screening component to achieve power. This paper considers the same problem but from a different perspective and shows that the standard CD test remains valid if the latent factors are weak, and proposes a simple bias-corrected CD test, labelled CD*, which is shown to be asymptotically normal, irrespective of whether the latent factors are weak or strong. This result is shown to hold for pure latent factor models as well as for panel regressions with latent factors. Small sample properties of the CD* test are investigated by Monte Carlo experiments and are shown to have the correct size and satisfactory power for both Gaussian and non-Gaussian errors. In contrast, it is found that JR's test tends to over-reject in the case of panels with non-Gaussian errors, and have low power against spatial network alternatives. The use of the CD* test is illustrated with two empirical applications from the literature.
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