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引用次数: 0

摘要

热循环后,在六层印刷电路板的镀通孔之间发现了开路电路。铜镀层在失效区域非常薄,但在最初的测试中确实产生了电接触。在热循环过程中,环氧板和铜之间的z-膨胀差异导致薄镀层开裂。在对四层电路板进行电气测试时,发现在镀通孔之间有一个开路电路。镀层的不连续性是由于使用钝钻在不适当的转速和/或进给速率下钻孔不佳造成的,如镀层不均匀和镀层中形成结核。在第三个例子中,在两个相邻的镀通孔之间的六层板中发现了一个开路电路。导体的一侧有一个连接两个孔的电镀孔。从板的一侧测试时发现连续性,但从另一侧测试时失去连续性。在第四个案例中,在六层印刷电路板上的镀通孔和触点垫之间发现了开路,这是由蚀刻缺陷引起的。
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Printed Circuit Board Failures at Plated Through Holes
An open electrical circuit was found between plated through-holes in a six-layer printed circuit board after thermal cycling. The copper plating was very thin in the failure area but did make an electrical contact during initial testing. During thermal cycling, differential z-expansion between the epoxy board and copper caused the thin plating to crack. During electrical testing of a four-layer circuit board, an open electrical circuit was found between the plated through-holes. Plating discontinuity was caused by poor drilling using a dull drill with improper speed (rpm) and/or feed rate as was observed by nonuniform plating and nodule formation in the plated layer. In a third example, an open electrical circuit was found in a six-layer board between two adjacent plated through-holes. A plating void was on one side of the conductor joining the two holes. Continuity was found when tested from one side of the board but lost when tested from the other. In a fourth case, an open circuit found between a plated through-hole and contact pad on a six-layer printed circuit board was caused by an etching defect.
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