用于SiPM电荷和快速鉴别读出的专用集成电路KLauS的表征结果和首次应用

K. Briggl, W. Shen, T. Harion, R. Hagdorn, P. Eckert, T. Klapdor-Kleingrothaus, M. Dorn, H. Schultz-Coulon
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引用次数: 1

摘要

KLauS是采用AMS 0.35μm SiGe技术生产的ASIC,用于读取来自硅光电倍增管的电荷信号。根据CALICE合作中AHCAL概念所追求的未来高粒度量热计的模拟前端,ASIC应该在大动态范围内以高精度测量传感器的电荷信号。为了单独补偿每个传感器的偏置和温度波动,实现了一个8位DAC来调节输入端的电压。利用集成的低抖动快速比较器,可以以亚纳秒的分辨率测量时间信息。使用功率门控技术可以进一步降低ASIC的低功耗。未来版本的KLauS正在开发中,它将包含一个分辨率高达12位的ADC以及用于数字数据传输的模块。介绍了克劳斯芯片的最新表征结果,以及基于克劳斯的测试装置的结果,该测试装置用于AHCAL测试束程序中使用的闪烁体瓦片的质量表征。
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Characterization results and first applications of KLauS - an ASIC for SiPM charge and fast discrimination readout
KLauS is an ASIC produced in the AMS 0.35μm SiGe technology to read out the charge signals from silicon photomultipliers. Developed as an analog front end for future calorimeters with high granularity as pursued by the AHCAL concept in the CALICE collaboration, the ASIC is supposed to measure the charge signal of the sensors in a large dynamic range and with a high precision. In order to compensate bias and temperature fluctuations of each sensor individually, an 8-bit DAC to tune the voltage at the input terminal is implemented. Using an integrated fast comparator with low jitter, the time information can be measured with sub-nanosecond resolution. The low power consumption of the ASIC can be further decreased using power gating techniques. Future versions of KLauS are under development and will incorporate an ADC with a resolution of up to 12 bit together with blocks for digital data transmission. Most recent characterization results for the KLauS chip are presented as well as results from a KLauS-based test setup developed for mass characterization of scintillator tiles used in the AHCAL test beam program.
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