基于晶体管逻辑故障检测模块的h桥开路故障检测方法

Godvin Joseph, Lalith Kumar Sahu
{"title":"基于晶体管逻辑故障检测模块的h桥开路故障检测方法","authors":"Godvin Joseph, Lalith Kumar Sahu","doi":"10.1109/ICICCSP53532.2022.9862403","DOIUrl":null,"url":null,"abstract":"This paper presents a fault detection technique that can be implemented in most of the dc-ac converters for the detection of open circuit switch faults. The proposed fault detection method uses a fault detection module (FDM) based on transistor logic which can be connected across individual power electronic switches in the topology. A faulty switch in topology is identified on the basis of charge across the capacitor present in this FDM. A switch is healthy if the voltage across this capacitor is nearly zero and not healthy if the capacitor is fully charged. There is no need for additional fault detecting algorithms for this fault detection method. This fault detection technique is simulated on an H-bridge inverter. The effectiveness of the FDM is validated by hardware implementation on an H-bridge inverter.","PeriodicalId":326163,"journal":{"name":"2022 International Conference on Intelligent Controller and Computing for Smart Power (ICICCSP)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Open Circuit Fault Detection Method for H-Bridge using Transistor Logic Fault Detection Module\",\"authors\":\"Godvin Joseph, Lalith Kumar Sahu\",\"doi\":\"10.1109/ICICCSP53532.2022.9862403\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a fault detection technique that can be implemented in most of the dc-ac converters for the detection of open circuit switch faults. The proposed fault detection method uses a fault detection module (FDM) based on transistor logic which can be connected across individual power electronic switches in the topology. A faulty switch in topology is identified on the basis of charge across the capacitor present in this FDM. A switch is healthy if the voltage across this capacitor is nearly zero and not healthy if the capacitor is fully charged. There is no need for additional fault detecting algorithms for this fault detection method. This fault detection technique is simulated on an H-bridge inverter. The effectiveness of the FDM is validated by hardware implementation on an H-bridge inverter.\",\"PeriodicalId\":326163,\"journal\":{\"name\":\"2022 International Conference on Intelligent Controller and Computing for Smart Power (ICICCSP)\",\"volume\":\"15 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-07-21\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 International Conference on Intelligent Controller and Computing for Smart Power (ICICCSP)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICICCSP53532.2022.9862403\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 International Conference on Intelligent Controller and Computing for Smart Power (ICICCSP)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICICCSP53532.2022.9862403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1

摘要

本文提出了一种适用于大多数直流-交流变换器开路开关故障检测的故障检测技术。提出的故障检测方法使用基于晶体管逻辑的故障检测模块(FDM),该模块可以跨拓扑中的各个电力电子开关连接。拓扑中的故障开关是根据该FDM中电容的电荷来确定的。如果电容器上的电压接近于零,开关是健康的,如果电容器充满电,开关是不健康的。这种故障检测方法不需要额外的故障检测算法。在h桥逆变器上对该故障检测技术进行了仿真。通过在h桥逆变器上的硬件实现,验证了FDM的有效性。
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Open Circuit Fault Detection Method for H-Bridge using Transistor Logic Fault Detection Module
This paper presents a fault detection technique that can be implemented in most of the dc-ac converters for the detection of open circuit switch faults. The proposed fault detection method uses a fault detection module (FDM) based on transistor logic which can be connected across individual power electronic switches in the topology. A faulty switch in topology is identified on the basis of charge across the capacitor present in this FDM. A switch is healthy if the voltage across this capacitor is nearly zero and not healthy if the capacitor is fully charged. There is no need for additional fault detecting algorithms for this fault detection method. This fault detection technique is simulated on an H-bridge inverter. The effectiveness of the FDM is validated by hardware implementation on an H-bridge inverter.
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