{"title":"近场:嵌入式电子系统的数值模拟与实验验证","authors":"J. L. Silveira, A. Raizer, F. Nyland, L. Pichon","doi":"10.1109/EMCEUROPE.2012.6396679","DOIUrl":null,"url":null,"abstract":"Validating measurements of electromagnetic field in near-field zone is a general target in research within electromagnetism area. This paper aims to present the results obtained from measurements and simulations of near-fields generated by a stand-alone electronic device. Measurements were performed in an anechoic chamber using probes connected by optical fibers as well as simulations using commercial software and own codes based on TLM-TD method.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"24 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"Near-fields: Numerical modeling and experimental validation in embedded electronic systems\",\"authors\":\"J. L. Silveira, A. Raizer, F. Nyland, L. Pichon\",\"doi\":\"10.1109/EMCEUROPE.2012.6396679\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Validating measurements of electromagnetic field in near-field zone is a general target in research within electromagnetism area. This paper aims to present the results obtained from measurements and simulations of near-fields generated by a stand-alone electronic device. Measurements were performed in an anechoic chamber using probes connected by optical fibers as well as simulations using commercial software and own codes based on TLM-TD method.\",\"PeriodicalId\":377100,\"journal\":{\"name\":\"International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"volume\":\"24 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2012-12-31\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"International Symposium on Electromagnetic Compatibility - EMC EUROPE\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMCEUROPE.2012.6396679\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCEUROPE.2012.6396679","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Near-fields: Numerical modeling and experimental validation in embedded electronic systems
Validating measurements of electromagnetic field in near-field zone is a general target in research within electromagnetism area. This paper aims to present the results obtained from measurements and simulations of near-fields generated by a stand-alone electronic device. Measurements were performed in an anechoic chamber using probes connected by optical fibers as well as simulations using commercial software and own codes based on TLM-TD method.
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