{"title":"考虑临界场和势降的三维模拟树形分形分析","authors":"S. Kobayashi, T. Arai, K. Kudo","doi":"10.1109/ISEIM.1995.496506","DOIUrl":null,"url":null,"abstract":"In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and /spl eta/ (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations.","PeriodicalId":130178,"journal":{"name":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","volume":"27 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-09-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Fractal analysis of 3D simulated tree patterns considering critical field and potential drop\",\"authors\":\"S. Kobayashi, T. Arai, K. Kudo\",\"doi\":\"10.1109/ISEIM.1995.496506\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and /spl eta/ (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations.\",\"PeriodicalId\":130178,\"journal\":{\"name\":\"Proceedings of 1995 International Symposium on Electrical Insulating Materials\",\"volume\":\"27 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-09-17\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of 1995 International Symposium on Electrical Insulating Materials\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISEIM.1995.496506\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of 1995 International Symposium on Electrical Insulating Materials","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEIM.1995.496506","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Fractal analysis of 3D simulated tree patterns considering critical field and potential drop
In this paper, we simulated 3D tree patterns with the field controlled random nature and used the parameters Vapp (applied voltage), Vd (potential drop in a tree channel), Ec (critical field for tree propagation) and /spl eta/ (the relation between local field and growing probability). As a result, the various shapes of tree patterns are obtained and the model holds more physical realizations.
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