Distributed automatic test pattern generation with a parallel FAN algorithm

The generation of test patterns for digital circuits is known as an NP hard problem. Due to the backtracking mechanism in the sequential algorithms for test pattern generation it is difficult to speed up the process. In this paper we present a parallel formulation of the FAN algorithm implemented on a heterogeneous cluster of workstations. Two different methods are used to take into account easy- and hard-to-detect faults. We show the strategies for our parallel implementations as well as implementation details. Linear speedups are shown with the results. Furthermore we introduce a new method for test vector compaction using a genetic algorithm. This results in smaller test sets compared to traditional methods. The reader should be familiar with notations of the FAN algorithm.