Е-polarized波在多层介质结构中的传播模型

P. Zabolotnyi
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摘要

本文研究了用无线电波干涉法测定多层介质结构的介电常数。在一般情况下,在干涉测量中,对一个反射系数的测量值可能对应无穷个介电常数。这种模糊性可以通过首先确定探测电磁波的不同参数对反射系数的影响来解决。特别是,有必要初步估计入射角和偏振对反射系数随其中一个结构参数变化范围的影响。本文研究了平面e极化电磁波,即磁场垂直于入射平面的电磁波入射到多层介质结构上的情况。本工作的目的是建立一个e极化电磁波在任意入射角下通过多层介电结构的传播模型,并确定反射系数随各层介电常数变化的范围。本文提出了e极化电磁波在双层介质结构中的传播模型。金属基底是一种理想的导体,是该结构的基础。电磁波从空气中以任意入射角入射。在此基础上,提出了一种测量相对介电常数和介电损耗正切的方法。结果表明,在正入射下,H偏振和e偏振的反射系数大小是相同的。因此,确定相对介电常数和测量反射系数大小的正切损失不仅需要在正入射下测量,还需要在斜入射下测量,在斜入射下,H极化和e极化的反射系数大小将不同。
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Model of Е-polarized wave propagation in a multilayer dielectric structure
This paper addresses the determination of the dielectric constant of multilayer dielectric structures by radiowave interferometry. In the general case, in interferometry measurements to one measured value of the reflection coefficient there may correspond an infinity of dielectric constants. This ambiguity may be resolved by first determining the effect of different parameters of the probing electromagnetic wave on the reflection coefficient. In particular, it is important to have a preliminary estimate of the effect of the incidence angle and the polarization on the range of variation of the reflection coefficient with the variation of one of the structure parameters. This paper considers the case where a plane E-polarized electromagnetic wave, i.e. a wave whose magnetic field is perpendicular to the incidence plane, is incident on a multilayer dielectric structure. The aim of this work is to develop a model of the propagation of an E-polarized electromagnetic wave through a multilayer dielectric structure at an arbitrary incidence angle and to determine the range of variation of the reflection coefficient with the variation of the dielectric constants of the layers. The paper presents a model of the propagation of an E-polarized electromagnetic wave in a two-layer dielectric structure. A metal base, which is an ideal conductor, underlies the structure. The electromagnetic wave is incident from the air at an arbitrary incidence angle. Based on the model, a method is proposed for measuring the relative dielectric constant and the dielectric loss tangent. It is shown that at a normal incidence the reflection coefficient magnitude is the same both for H- and E-polarization. Because of this, determining the relative dielectric constant and the loss tangent from the measured reflection coefficient magnitude calls for measurements not only at a normal incidence, but also at an oblique incidence, at which the reflection coefficient magnitudes will be different for H- and E-polarization.
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