{"title":"测试模式生成的高效冗余识别","authors":"Sangyun Han, Sungho Kang","doi":"10.1109/ASIC.1997.616977","DOIUrl":null,"url":null,"abstract":"Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient in identifying redundant faults.","PeriodicalId":300310,"journal":{"name":"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Efficient redundancy identification for test pattern generation\",\"authors\":\"Sangyun Han, Sungho Kang\",\"doi\":\"10.1109/ASIC.1997.616977\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient in identifying redundant faults.\",\"PeriodicalId\":300310,\"journal\":{\"name\":\"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1997-09-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ASIC.1997.616977\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. Tenth Annual IEEE International ASIC Conference and Exhibit (Cat. No.97TH8334)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ASIC.1997.616977","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Efficient redundancy identification for test pattern generation
Due to the reconvergent fanouts which make the dependency among objectives and block the fault propagation, there may exist redundant faults in the circuits. This paper presents the isomorphism identification algorithm and the pseudo dominator algorithm which are used to identify redundant faults. Experimental results on ISCAS 85 benchmark circuits show that these algorithms are efficient in identifying redundant faults.
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