电网分析的随机方法

Sanjay Pant, D. Blaauw, V. Zolotov, S. Sundareswaran, R. Panda
{"title":"电网分析的随机方法","authors":"Sanjay Pant, D. Blaauw, V. Zolotov, S. Sundareswaran, R. Panda","doi":"10.1145/996566.996616","DOIUrl":null,"url":null,"abstract":"Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.","PeriodicalId":115059,"journal":{"name":"Proceedings. 41st Design Automation Conference, 2004.","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2004-06-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"54","resultStr":"{\"title\":\"A stochastic approach to power grid analysis\",\"authors\":\"Sanjay Pant, D. Blaauw, V. Zolotov, S. Sundareswaran, R. Panda\",\"doi\":\"10.1145/996566.996616\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.\",\"PeriodicalId\":115059,\"journal\":{\"name\":\"Proceedings. 41st Design Automation Conference, 2004.\",\"volume\":\"29 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2004-06-07\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"54\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings. 41st Design Automation Conference, 2004.\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/996566.996616\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings. 41st Design Automation Conference, 2004.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/996566.996616","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 54

摘要

电源完整性分析对于现代高能效设计至关重要。在本文中,我们提出了一种随机方法,用于获取电源网络中集体 IR 和 LdI/dt 下降的统计信息。我们将设计中各块从电网汲取的电流模拟为随机过程,并提取其统计信息,包括各块之间在空间和时间上的相关信息。然后,我们提出了一种通过电网线性模型传播块电流统计参数的方法,以获得电网中任意节点电压降的平均值和标准偏差。我们证明,运行时间与电流波形的长度呈线性关系,因此可以分析多达数百万个周期的大量矢量。我们在许多电网(包括来自工业微处理器的电网)上实施了该方法,并证明了其准确性和效率。建议的统计分析可用于确定电网的哪些部分最有可能发生故障,并为统计时序分析等其他分析提供信息。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
A stochastic approach to power grid analysis
Power supply integrity analysis is critical in modern high perfor-mance designs. In this paper, we propose a stochastic approach to obtain statistical information about the collective IR and LdI/dt drop in a power supply network. The currents drawn from the power grid by the blocks in a design are modelled as stochastic processes and their statistical information is extracted, including correlation infor-mation between blocks in both space and time. We then propose a method to propagate the statistical parameters of the block currents through the linear model of the power grid to obtain the mean and standard deviation of the voltage drops at any node in the grid. We show that the run time is linear with the length of the current wave-forms allowing for extensive vectors, up to millions of cycles, to be analyzed. We implemented the approach on a number of grids, including a grid from an industrial microprocessor and demonstrate its accuracy and efficiency. The proposed statistical analysis can be use to determine which portions of the grid are most likely to fail as well as to provide information for other analyses, such as statistical timing analysis.
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
期刊最新文献
STAC: statistical timing analysis with correlation Large-scale placement by grid-warping Security as a new dimension in embedded system design An integrated hardware/software approach for run-time scratchpad management Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1