Wei-Jiang Zhao, Hark-Byeong Park, Matthias H. Y. Tan, H. Park, E. Liu, Eakhwan Song, E. Li
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Far-field prediction from amplitude-only near-field measurements using equivalent electric currents
A general and flexible approach is presented for predicting far-field radiated emissions from a device using phaseless magnetic near-field scan data, which is based on the replacement of the actual radiating sources by an equivalent set of electric currents over a planar surface near the device. These equivalent currents used to predict the far-field radiated emissions are determined from near-field scan data by solving two independent nonlinear inverse problems with a global optimization algorithm. Numerical examples are presented to demonstrate the validity and capability of the presented approach.