Youngho Choi, Jaeook Kwon, Seokjae Jeong, Hansub Park, Y. Eom
{"title":"正在进行的工作:基于操作系统级分析的嵌入式系统轻量级死锁检测技术","authors":"Youngho Choi, Jaeook Kwon, Seokjae Jeong, Hansub Park, Y. Eom","doi":"10.1109/EMSOFT.2018.8537214","DOIUrl":null,"url":null,"abstract":"In this paper, we propose a dynamic analysis technique that diagnoses various kinds of deadlocks of embedded devices by OS-level analysis. Especially, we focus on minimizing performance overhead while inspecting deadlocks, because embedded applications run with limited system resources. Our experimental results show that our scheme detects all deadlocks which are induced in our test cases and incurs reasonable performance overhead (up to 16%), compared with the conventional scheme.","PeriodicalId":375994,"journal":{"name":"2018 International Conference on Embedded Software (EMSOFT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-09-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"4","resultStr":"{\"title\":\"Work-in-Progress: Lightweight Deadlock Detection Technique for Embedded Systems via OS-Level Analysis\",\"authors\":\"Youngho Choi, Jaeook Kwon, Seokjae Jeong, Hansub Park, Y. Eom\",\"doi\":\"10.1109/EMSOFT.2018.8537214\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, we propose a dynamic analysis technique that diagnoses various kinds of deadlocks of embedded devices by OS-level analysis. Especially, we focus on minimizing performance overhead while inspecting deadlocks, because embedded applications run with limited system resources. Our experimental results show that our scheme detects all deadlocks which are induced in our test cases and incurs reasonable performance overhead (up to 16%), compared with the conventional scheme.\",\"PeriodicalId\":375994,\"journal\":{\"name\":\"2018 International Conference on Embedded Software (EMSOFT)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2018-09-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"4\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2018 International Conference on Embedded Software (EMSOFT)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EMSOFT.2018.8537214\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2018 International Conference on Embedded Software (EMSOFT)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMSOFT.2018.8537214","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Work-in-Progress: Lightweight Deadlock Detection Technique for Embedded Systems via OS-Level Analysis
In this paper, we propose a dynamic analysis technique that diagnoses various kinds of deadlocks of embedded devices by OS-level analysis. Especially, we focus on minimizing performance overhead while inspecting deadlocks, because embedded applications run with limited system resources. Our experimental results show that our scheme detects all deadlocks which are induced in our test cases and incurs reasonable performance overhead (up to 16%), compared with the conventional scheme.