{"title":"微带弯曲线上皮秒脉冲传输的新型光学近场测绘探针测量","authors":"Jongjoo Lee, Joungho Kim","doi":"10.1109/EPEP.2001.967625","DOIUrl":null,"url":null,"abstract":"Picosecond electric-pulse propagation properties on microstrip meander lines on a printed circuit board were measured using a novel optical photoconductive near-field mapping probe. The time-varying, 2-D spatial tangential near-field distribution images were successfully obtained.","PeriodicalId":174339,"journal":{"name":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Picosecond-pulse propagation measurement on microstrip meander lines using a novel optical near-field mapping probe\",\"authors\":\"Jongjoo Lee, Joungho Kim\",\"doi\":\"10.1109/EPEP.2001.967625\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Picosecond electric-pulse propagation properties on microstrip meander lines on a printed circuit board were measured using a novel optical photoconductive near-field mapping probe. The time-varying, 2-D spatial tangential near-field distribution images were successfully obtained.\",\"PeriodicalId\":174339,\"journal\":{\"name\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"volume\":\"2 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2001-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/EPEP.2001.967625\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE 10th Topical Meeting on Electrical Performance of Electronic Packaging (Cat. No. 01TH8565)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPEP.2001.967625","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Picosecond-pulse propagation measurement on microstrip meander lines using a novel optical near-field mapping probe
Picosecond electric-pulse propagation properties on microstrip meander lines on a printed circuit board were measured using a novel optical photoconductive near-field mapping probe. The time-varying, 2-D spatial tangential near-field distribution images were successfully obtained.