{"title":"X-Check: gpu加速设计规则检查通过并行横扫线算法","authors":"Zhuolun He, Yuzhe Ma, Bei Yu","doi":"10.1145/3508352.3549383","DOIUrl":null,"url":null,"abstract":"Design rule checking (DRC) is essential in physical verification to ensure high yield and reliability for VLSI circuit designs. To achieve reasonable design cycle time, acceleration for computationally intensive DRC tasks has been demanded to accommodate the ever-growing complexity of modern VLSI circuits. In this paper, we pro-pose X-Check, a GPU-accelerated design rule checker. X-Check integrates novel parallel sweepline algorithms, which are both efficient in practice and with nontrivial theoretical guarantees. Experimental results have demonstrated significant speedup achieved by X-Check compared with a multi-threaded CPU checker.","PeriodicalId":270592,"journal":{"name":"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":"{\"title\":\"X-Check: GPU-Accelerated Design Rule Checking via Parallel Sweepline Algorithms\",\"authors\":\"Zhuolun He, Yuzhe Ma, Bei Yu\",\"doi\":\"10.1145/3508352.3549383\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Design rule checking (DRC) is essential in physical verification to ensure high yield and reliability for VLSI circuit designs. To achieve reasonable design cycle time, acceleration for computationally intensive DRC tasks has been demanded to accommodate the ever-growing complexity of modern VLSI circuits. In this paper, we pro-pose X-Check, a GPU-accelerated design rule checker. X-Check integrates novel parallel sweepline algorithms, which are both efficient in practice and with nontrivial theoretical guarantees. Experimental results have demonstrated significant speedup achieved by X-Check compared with a multi-threaded CPU checker.\",\"PeriodicalId\":270592,\"journal\":{\"name\":\"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)\",\"volume\":\"10 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2022-10-29\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"1\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1145/3508352.3549383\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1145/3508352.3549383","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
X-Check: GPU-Accelerated Design Rule Checking via Parallel Sweepline Algorithms
Design rule checking (DRC) is essential in physical verification to ensure high yield and reliability for VLSI circuit designs. To achieve reasonable design cycle time, acceleration for computationally intensive DRC tasks has been demanded to accommodate the ever-growing complexity of modern VLSI circuits. In this paper, we pro-pose X-Check, a GPU-accelerated design rule checker. X-Check integrates novel parallel sweepline algorithms, which are both efficient in practice and with nontrivial theoretical guarantees. Experimental results have demonstrated significant speedup achieved by X-Check compared with a multi-threaded CPU checker.