纳米颗粒油墨复合多层电路气溶胶喷射增材印刷的烧结工艺条件

P. Lall, Jinesh Narangaparambil, Ved Soni, Scott Miller
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引用次数: 3

摘要

柔性电子产品已成为消费和国防应用中的一种新形式。气溶胶喷射打印技术已经显示出在平面和非平面表面上进行柔性电子器件增材打印的潜力。所需线条的宽度可以通过控制工艺参数而变化,允许打印宽度为5-10μm的非常窄的痕迹。迄今为止报道的研究主要集中在考虑湿度、温度和应变率等各种参数的单层打印。然而,传统的PCB是多层的,对于在现实世界中使用的柔性PCB来说,重要的是要有多层堆叠的互连,并通过过孔建立z轴互连,就像目前在传统PCB中一样。使用添加剂方法,如气溶胶印刷方法,提供了很大的设计自由度,而不需要专门的掩模来建立不同油墨的互连,如银,铜和碳。本文的目的是借助气溶胶可打印银油墨和介电聚酰亚胺油墨建立z轴互连。银油墨将使用超声波雾化器来打印,而气动雾化器必须用于聚酰亚胺油墨。在不同的烧结条件下,对印制的导电线进行了互连电阻和剪切载荷等参数的测试。
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Sintering Process Conditions for Additive Printing of Multi-Layer Circuitry Aerosol-Jet Process in Conjunction with Nanoparticle Ink
Flexible electronics has emerged as a new form-factor in the consumer and defense applications. Aerosol-Jet Printing technology has shown potential for additive printing of flexible electronics on both planar and non-planar surfaces. The width of the needed lines can varied through control of the process parameters allowing the printing of very narrow traces of the order of 5-10μm in width. Reported research till date primarily concentrates on the single-layer printing with consideration of various parameters like humidity, temperature and strain rate. However, conventional PCBs are multi-layered and for the flexible PCB to be used in real-world it is important to have multi-layer stacking of interconnects and establish z-axis interconnections through vias as currently in the conventional PCBs. Use of additive methods such as aerosol printing method provides a great amount of design freedom without the need for specialized masks to establish the interconnects for different inks available like silver, copper, and carbon. In this paper, the objective is to establish z-axis interconnections with the help of Aerosol printable silver ink and dielectric polyimide ink. The silver ink would be using the ultrasonic atomizer to print, and the pneumatic atomizer has to be used for the polyimide ink. The printed conductive lines have been subjected to different sintering conditions and then tested for the parameters like resistance across the interconnects and shear load to failure.
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