{"title":"使用局部电压量值测量分布高阻抗故障定位","authors":"Shamina Hossain, Hao Zhu, T. Overbye","doi":"10.1109/NAPS.2014.6965403","DOIUrl":null,"url":null,"abstract":"The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.","PeriodicalId":421766,"journal":{"name":"2014 North American Power Symposium (NAPS)","volume":"506 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2014-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"Distribution high impedance fault location using localized voltage magnitude measurements\",\"authors\":\"Shamina Hossain, Hao Zhu, T. Overbye\",\"doi\":\"10.1109/NAPS.2014.6965403\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.\",\"PeriodicalId\":421766,\"journal\":{\"name\":\"2014 North American Power Symposium (NAPS)\",\"volume\":\"506 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2014-11-24\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2014 North American Power Symposium (NAPS)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAPS.2014.6965403\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2014 North American Power Symposium (NAPS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAPS.2014.6965403","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Distribution high impedance fault location using localized voltage magnitude measurements
The detection and location of high impedance faults has historically been a difficult endeavor due to the low currents produced. However, the recent advent of distributed voltage monitoring devices, enabling access to fast-sampled, expansive voltage measurements throughout a distribution network, can ease this task. This paper considers the potential to use these distribution level devices to detect and locate such faults. A simulation-based method is proposed that compares a measured voltage profile, obtained from the devices, and simulated voltage profiles at various locations using a power system simulation software. The simulation locations are intelligently selected using the Golden section search and possible fault impedance values are iterated through for each location. The L1-norm is used to compare the two profiles, with the lowest error norm representing the best match - the most likely fault location and impedance.