A. Jarndal, Pouya Aflaki, L. Degachi, A. Birafane, A. Kouki, R. Negra, F. Ghannouchi
{"title":"AlGaN/GaN hemt大信号模型,适用于射频开关模式功率放大器设计","authors":"A. Jarndal, Pouya Aflaki, L. Degachi, A. Birafane, A. Kouki, R. Negra, F. Ghannouchi","doi":"10.1016/J.ENDEND.2010.06.032","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":424132,"journal":{"name":"Journal of End-to-end-testing","volume":"66 7 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2010-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":"{\"title\":\"Large-signal model for AlGaN/GaN HEMTs suitable for RF switching-mode power amplifiers design\",\"authors\":\"A. Jarndal, Pouya Aflaki, L. Degachi, A. Birafane, A. Kouki, R. Negra, F. Ghannouchi\",\"doi\":\"10.1016/J.ENDEND.2010.06.032\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":424132,\"journal\":{\"name\":\"Journal of End-to-end-testing\",\"volume\":\"66 7 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2010-07-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"26\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Journal of End-to-end-testing\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1016/J.ENDEND.2010.06.032\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of End-to-end-testing","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1016/J.ENDEND.2010.06.032","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}