{"title":"ABILBO:模拟内置块观察者","authors":"M. Lubaszewski, S. Mir, Leandro Pulz","doi":"10.1109/ICCAD.1996.569917","DOIUrl":null,"url":null,"abstract":"This paper presents a novel multifunctional test structure called Analog BulLt-in Block Observer (ABILBO). This structure is based on analog integrators and achieves analog scan, test frequency generation and test response compaction. A high fault coverage was obtained by using a discrete switched-capacitor ABILBO for testing a biquad filter. The ABILBO area overhead and performance penalty can be very low if functional and testing circuitry are shared. This is typically the case of high order filters based on a cascade of biquads.","PeriodicalId":408850,"journal":{"name":"Proceedings of International Conference on Computer Aided Design","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-11-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"20","resultStr":"{\"title\":\"ABILBO: Analog BuILt-in block observer\",\"authors\":\"M. Lubaszewski, S. Mir, Leandro Pulz\",\"doi\":\"10.1109/ICCAD.1996.569917\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents a novel multifunctional test structure called Analog BulLt-in Block Observer (ABILBO). This structure is based on analog integrators and achieves analog scan, test frequency generation and test response compaction. A high fault coverage was obtained by using a discrete switched-capacitor ABILBO for testing a biquad filter. The ABILBO area overhead and performance penalty can be very low if functional and testing circuitry are shared. This is typically the case of high order filters based on a cascade of biquads.\",\"PeriodicalId\":408850,\"journal\":{\"name\":\"Proceedings of International Conference on Computer Aided Design\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1996-11-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"20\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of International Conference on Computer Aided Design\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICCAD.1996.569917\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of International Conference on Computer Aided Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICCAD.1996.569917","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
This paper presents a novel multifunctional test structure called Analog BulLt-in Block Observer (ABILBO). This structure is based on analog integrators and achieves analog scan, test frequency generation and test response compaction. A high fault coverage was obtained by using a discrete switched-capacitor ABILBO for testing a biquad filter. The ABILBO area overhead and performance penalty can be very low if functional and testing circuitry are shared. This is typically the case of high order filters based on a cascade of biquads.
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