(InSb) 1-z (Sn2)z固溶体在GaAs和GaP衬底上的液相外延特性

Sh. N. Usmonov, Umida Asatova, A. Akhmedov
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引用次数: 0

摘要

采用液相外延的方法,在有限体积的铟溶液熔体中生长出窄间隙的锑化铟分子取代固溶体层。薄膜分别生长在GaAs(100)和GaP(111)衬底上。结果表明,锑化铟二元化合物在350 ~ 220℃的铟溶液中不会解离成单个的in和Sb原子,而主要以InSb分子的形式存在。研究了nGaAs-p$(InSb)_{1-z}(Sn_{2})_{1-z}$和nGaP-p$(InSb)_{1-z}}(Sn_{2})_{z}$结构的光敏性。发现了nGaP-p$(InSb)_{1-z}(Sn_{2})_{z}$结构的电流-电压特性与温度的异常关系。该模型考虑了随温度升高缺陷和“空位+复合杂质中心”型缺陷-杂质配合物形成的可能性,并对结果进行了解释。
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Features of Liquid–Phase Epitaxy of (InSb)1–z(Sn2)z Solid Solutions of Molecular Substitution on GaAs and GaP Substrates
By the method of liquid-phase epitaxy, narrow-gap layers of solid solutions of indium antimonide molecular substitution were grown from a limited volume of indium solution - melt. The layers were grown on GaAs (100) and GaP (111) substrates.It is shown that the binary compound of indium antimonide in an indium solution at temperatures of 350-220°C does not dissociate into individual In and Sb atoms, but is mainly in the form of InSb molecules. The photosensitivity of nGaAs-p$(InSb)_{1-z}(Sn_{2})_{1-z}$ and nGaP-p$(InSb)_{1-z}(Sn_{2})_{z}$ structures have been studied.An anomalous temperature dependence of the current-voltage characteristic of the nGaP-p$(InSb)_{1-z}(Sn_{2})_{z}$ structure was found. The results are explained on the basis of a model that takes into account the possibility of the formation of defects and defect-impurity complexes of the “vacancy + recombination impurity center” type with increasing temperature.
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