{"title":"CMOS集成磁场源作为基准，应用于常用基板上的磁场传感器","authors":"J. Trontelj, L. Trontelj, R. Opara, A. Pletersek","doi":"10.1109/IMTC.1994.351921","DOIUrl":null,"url":null,"abstract":"An integrated reference magnetic field generator was introduced for integrated Hall sensors. Its model was presented and analysed. A simple SPICE type design tool was developed. The described structure was designed and the model parameters extracted and verified. Extracted reference voltage is used for compensation of Hall sensitivity temperature, time and mechanical stress dependence compensation and for mass production testing.<<ETX>>","PeriodicalId":231484,"journal":{"name":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-05-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"9","resultStr":"{\"title\":\"CMOS integrated magnetic field source used as a reference in magnetic field sensors on common substrate\",\"authors\":\"J. Trontelj, L. Trontelj, R. Opara, A. Pletersek\",\"doi\":\"10.1109/IMTC.1994.351921\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"An integrated reference magnetic field generator was introduced for integrated Hall sensors. Its model was presented and analysed. A simple SPICE type design tool was developed. The described structure was designed and the model parameters extracted and verified. Extracted reference voltage is used for compensation of Hall sensitivity temperature, time and mechanical stress dependence compensation and for mass production testing.<<ETX>>\",\"PeriodicalId\":231484,\"journal\":{\"name\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1994-05-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"9\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/IMTC.1994.351921\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings. 10th Anniversary. IMTC/94. Advanced Technologies in I & M. 1994 IEEE Instrumentation and Measurement Technolgy Conference (Cat. No.94CH3424-9)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IMTC.1994.351921","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
CMOS integrated magnetic field source used as a reference in magnetic field sensors on common substrate
An integrated reference magnetic field generator was introduced for integrated Hall sensors. Its model was presented and analysed. A simple SPICE type design tool was developed. The described structure was designed and the model parameters extracted and verified. Extracted reference voltage is used for compensation of Hall sensitivity temperature, time and mechanical stress dependence compensation and for mass production testing.<>
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