{"title":"通过适当的滤波对相位阶跃干涉过程的图像增强","authors":"I. Younus","doi":"10.1109/NAECON.1998.710212","DOIUrl":null,"url":null,"abstract":"PSI (Phase Stepped Interferometry) is a well known technique for the measurement of surface deformation. Since in this technique phase characteristic of a linear system is computed using arctangent function, in some points the raw phase data exceeds the value 2/spl pi/. Moreover the surface roughness, phase unwrapping and extra noise imposed from the environment makes the surface look like a original surface with huge impulsive noise and simply using PSI technique does not produce accurate reconstructed surface. In this paper we propose a filtering technique that suppress the noise and enhance the image quality. We propose that the raw phase data should be prefiltered by a mean filter to eliminate Gaussian noise. Then after proper unwrapping treatment the data should be filtered with a RCM (Rank Conditioned Median) filter. This filter is effective at treating impulsive type noise and preserve step edges without blurring.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Image enhancement for the phase stepped interferometric process by appropriate filtering\",\"authors\":\"I. Younus\",\"doi\":\"10.1109/NAECON.1998.710212\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"PSI (Phase Stepped Interferometry) is a well known technique for the measurement of surface deformation. Since in this technique phase characteristic of a linear system is computed using arctangent function, in some points the raw phase data exceeds the value 2/spl pi/. Moreover the surface roughness, phase unwrapping and extra noise imposed from the environment makes the surface look like a original surface with huge impulsive noise and simply using PSI technique does not produce accurate reconstructed surface. In this paper we propose a filtering technique that suppress the noise and enhance the image quality. We propose that the raw phase data should be prefiltered by a mean filter to eliminate Gaussian noise. Then after proper unwrapping treatment the data should be filtered with a RCM (Rank Conditioned Median) filter. This filter is effective at treating impulsive type noise and preserve step edges without blurring.\",\"PeriodicalId\":202280,\"journal\":{\"name\":\"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1998-07-13\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/NAECON.1998.710212\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/NAECON.1998.710212","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Image enhancement for the phase stepped interferometric process by appropriate filtering
PSI (Phase Stepped Interferometry) is a well known technique for the measurement of surface deformation. Since in this technique phase characteristic of a linear system is computed using arctangent function, in some points the raw phase data exceeds the value 2/spl pi/. Moreover the surface roughness, phase unwrapping and extra noise imposed from the environment makes the surface look like a original surface with huge impulsive noise and simply using PSI technique does not produce accurate reconstructed surface. In this paper we propose a filtering technique that suppress the noise and enhance the image quality. We propose that the raw phase data should be prefiltered by a mean filter to eliminate Gaussian noise. Then after proper unwrapping treatment the data should be filtered with a RCM (Rank Conditioned Median) filter. This filter is effective at treating impulsive type noise and preserve step edges without blurring.