{"title":"BiCMOS混合模式集成电路中的信号隔离","authors":"K. Joardar","doi":"10.1109/BIPOL.1995.493892","DOIUrl":null,"url":null,"abstract":"Comparing several cross-talk reduction schemes using two-dimensional device simulation and measurements on silicon has shown that while SOI based processes provide high isolation from cross-talk, fully junction isolated wells can provide equal or better cross-talk immunity at a lesser expense. Simple guard ring substrate contacts appear to be the technique best suited for preventing cross-talk at high operating frequencies. A lumped parameter equivalent circuit has also been developed to simulate fully junction isolated wells in SPICE.","PeriodicalId":230944,"journal":{"name":"Proceedings of Bipolar/Bicmos Circuits and Technology Meeting","volume":"12 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"35","resultStr":"{\"title\":\"Signal isolation in BiCMOS mixed mode integrated circuits\",\"authors\":\"K. Joardar\",\"doi\":\"10.1109/BIPOL.1995.493892\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Comparing several cross-talk reduction schemes using two-dimensional device simulation and measurements on silicon has shown that while SOI based processes provide high isolation from cross-talk, fully junction isolated wells can provide equal or better cross-talk immunity at a lesser expense. Simple guard ring substrate contacts appear to be the technique best suited for preventing cross-talk at high operating frequencies. A lumped parameter equivalent circuit has also been developed to simulate fully junction isolated wells in SPICE.\",\"PeriodicalId\":230944,\"journal\":{\"name\":\"Proceedings of Bipolar/Bicmos Circuits and Technology Meeting\",\"volume\":\"12 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1995-10-02\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"35\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proceedings of Bipolar/Bicmos Circuits and Technology Meeting\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/BIPOL.1995.493892\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Bipolar/Bicmos Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1995.493892","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Signal isolation in BiCMOS mixed mode integrated circuits
Comparing several cross-talk reduction schemes using two-dimensional device simulation and measurements on silicon has shown that while SOI based processes provide high isolation from cross-talk, fully junction isolated wells can provide equal or better cross-talk immunity at a lesser expense. Simple guard ring substrate contacts appear to be the technique best suited for preventing cross-talk at high operating frequencies. A lumped parameter equivalent circuit has also been developed to simulate fully junction isolated wells in SPICE.