基于卫星图像数据的作物制图机器学习算法分析

Vineet Saxena, R. Dwivedi, Ashok Kumar
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摘要

作物分类是了解地球农业覆盖的主要领域。通过卫星图像进行的研究通常限于重访率低和/或空间分辨率粗糙的公共数据。然而,最近来自新航天公司的卫星数据激增,提供了相对较高空间分辨率的日常图像。由于卫星图像捕获的高重访率,可以将时间信息纳入作物分类方案。随着高节奏时间信息的出现,对于数据和分类方法的探索还有很大的空间[60]。作物作图方法用于监测各种作物类型。这些方法依赖于大空间的卫星图像和不同的时间序列数据值,用于支持向量机(svm)和随机森林(RF)等监督分类器[1]。这些分类器应用于三个独特的作物术语顺序,并将结果与准确性和执行时间进行比较。支持向量机提供了理想的执行,并且在分类的最低层次上比RF表现得更好。利用近红外(NIR)、植被红边(red-edge)、短波红外(SWIR)多光谱组以及归一化植被差异(Normalized Difference vegetation, NDVI)和植物衰老反射率(Plant Senescence Reflectance, PSRI)等信息因子的显著性进行作物前沿物候阶段和作物制图[2]。
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Analysis of Machine Learning Algorithms for Crop Mapping on Satellite Image Data
Crop classification is main area of our planet for understanding the agricultural cover. Studies via satellite imagery are often limited to public data with low revisit rates and/or coarse spatial resolution. However, a recent surge in satellite data from new-aerospace companies provides daily imagery with relatively high spatial resolution. With high revisit rates in satellite image capture enable the incorporation of temporal information into crop classification schemes. With high cadence temporal information just now becoming available, there is plenty of room to explore the data and methods for classification [60].Crop mapping methodology is used for the monitoring of various crop types. These methodology is depend on a large space of satellite imagery and different time series data values which is use in supervised classifiers such as Support Vector Machines (SVMs) and Random Forest (RF)[1]. These classifiers are applied at three unique degrees of crop terminology order and compare the result with accuracy and execution time. SVM gives ideal execution and demonstrates essentially better than RF for the least level of the classification. The significance of information factors such as Near Infrared (NIR), vegetation red-edge, and Short-Wave Infrared (SWIR) multispectral groups, and the Normalized Difference Vegetation (NDVI) and Plant Senescence Reflectance (PSRI) are used during cutting edge crop phenology stages and crop mapping [2].
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