基于深度学习算法的可编程视觉芯片芯片级验证方法

Xuemin Zheng, Mingxin Zhao, Qian Luo, Shuangming Yu, Liyuan Liu, N. Wu
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引用次数: 0

摘要

在过去的五年中,深度学习(DL)算法在计算机视觉领域取得了巨大的成功,因为它在许多视觉任务上具有很高的准确性。不幸的是,对于可编程视觉芯片的开发,由于深度学习神经网络的高计算复杂性,算法验证仍然是一个主要挑战。针对视觉芯片验证效率低、可重用性差等问题,提出了一种新的芯片级验证方法。与块级验证技术相比,该方法侧重于在芯片级验证中快速实现完整的深度学习算法,满足了带出前视觉芯片的先进性要求。在MobileNet-v1上的实验表明,该验证方法显著减少了仿真时间和调试开销。
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A Chip-Level Verification Method for Programmable Vision Chip Based on Deep Learning Algorithms
The past five years has witnessed tremendous success of deep learning (DL) algorithm in the computer vision field, attributing to its high degree of accuracy on numerous visual tasks. Unfortunately, for the development of programmable vision chips, algorithm verification remains a major challenge due to the high computational complexity of the DL neural network. In this paper, we propose a novel chip-level verification method to address the common issues including low efficiency and poor reusability in verifying vision chips. In contrast to the block-level verification technique, this method focuses on the rapid implementation of the complete DL algorithm in chip-level verification, fulfilling the advanced demands of vision chip prior to the tape-out. The experiments on MobileNet-v1 indicates the significant reduction of the simulation time and debugging overheads via the proposed verification method.
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