{"title":"输运诱导光栅干涉测量:在光折变Bi12TiO20中的应用","authors":"P. Xia, J. Partanen, R. Hellwarth","doi":"10.1364/pmed.1991.tuc8","DOIUrl":null,"url":null,"abstract":"We have developed a technique to measure interferometrically charge-transport-induced refractive index gratings in photoconductive insulators. All four parameters needed to describe fully the interaction between the two beams Bragg matched to the grating can be determined. We use the method to find that the complex optical polarizability of an occupied charge trap equals that of an unoccupied trap plus (0.7 − i4.5 ± 0.7 ± i0.4) × 10−22 cm3 in photorefractive Bi12TiO20.","PeriodicalId":355924,"journal":{"name":"Photorefractive Materials, Effects, and Devices","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Transport-induced-grating interferometry: application to photorefractive Bi12TiO20\",\"authors\":\"P. Xia, J. Partanen, R. Hellwarth\",\"doi\":\"10.1364/pmed.1991.tuc8\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"We have developed a technique to measure interferometrically charge-transport-induced refractive index gratings in photoconductive insulators. All four parameters needed to describe fully the interaction between the two beams Bragg matched to the grating can be determined. We use the method to find that the complex optical polarizability of an occupied charge trap equals that of an unoccupied trap plus (0.7 − i4.5 ± 0.7 ± i0.4) × 10−22 cm3 in photorefractive Bi12TiO20.\",\"PeriodicalId\":355924,\"journal\":{\"name\":\"Photorefractive Materials, Effects, and Devices\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Photorefractive Materials, Effects, and Devices\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1364/pmed.1991.tuc8\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Photorefractive Materials, Effects, and Devices","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/pmed.1991.tuc8","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Transport-induced-grating interferometry: application to photorefractive Bi12TiO20
We have developed a technique to measure interferometrically charge-transport-induced refractive index gratings in photoconductive insulators. All four parameters needed to describe fully the interaction between the two beams Bragg matched to the grating can be determined. We use the method to find that the complex optical polarizability of an occupied charge trap equals that of an unoccupied trap plus (0.7 − i4.5 ± 0.7 ± i0.4) × 10−22 cm3 in photorefractive Bi12TiO20.
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