用简单的E函数拟合加速TDDB能否预测工作电压下的介电退化?

{"title":"用简单的E函数拟合加速TDDB能否预测工作电压下的介电退化?","authors":"G. Haase","doi":"10.2172/1825587","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":416854,"journal":{"name":"Proposed for presentation at the International Integrated Reliability Workshop (Virtual).","volume":"28 6 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Can fitting of accelerated TDDB with a simple function of E predict the dielectric degradation under operating voltages?.\",\"authors\":\"G. Haase\",\"doi\":\"10.2172/1825587\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"\",\"PeriodicalId\":416854,\"journal\":{\"name\":\"Proposed for presentation at the International Integrated Reliability Workshop (Virtual).\",\"volume\":\"28 6 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2020-10-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Proposed for presentation at the International Integrated Reliability Workshop (Virtual).\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.2172/1825587\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proposed for presentation at the International Integrated Reliability Workshop (Virtual).","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.2172/1825587","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}