{"title":"采用自举技术设计低漏电电路","authors":"V. Sharma","doi":"10.1109/ICSCN.2017.8085677","DOIUrl":null,"url":null,"abstract":"Leakage power dissipation is drastically increasing with the scaling of the each new technology node. The number of gates per chip has increased for improving the performance of the circuits, rise in operating frequency and many more has resulted in greater leakage power dissipation. That demands low power integrated circuits (ICs). In this paper, bootstrapping technique has been used so as to overcome the leakage power dissipation. 4:1 multiplexer is designed by using bootstrapping technique at 32nm technology node and the results are obtained using Silvaco's tools. The leakage power result obtained had been taken at different voltages (1V, 0.8V, 0.6V, 0.4V) for checking the effect of voltage scaling.","PeriodicalId":383458,"journal":{"name":"2017 Fourth International Conference on Signal Processing, Communication and Networking (ICSCN)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Low leakage circuit design using bootstrap technique\",\"authors\":\"V. Sharma\",\"doi\":\"10.1109/ICSCN.2017.8085677\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Leakage power dissipation is drastically increasing with the scaling of the each new technology node. The number of gates per chip has increased for improving the performance of the circuits, rise in operating frequency and many more has resulted in greater leakage power dissipation. That demands low power integrated circuits (ICs). In this paper, bootstrapping technique has been used so as to overcome the leakage power dissipation. 4:1 multiplexer is designed by using bootstrapping technique at 32nm technology node and the results are obtained using Silvaco's tools. The leakage power result obtained had been taken at different voltages (1V, 0.8V, 0.6V, 0.4V) for checking the effect of voltage scaling.\",\"PeriodicalId\":383458,\"journal\":{\"name\":\"2017 Fourth International Conference on Signal Processing, Communication and Networking (ICSCN)\",\"volume\":\"26 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2017-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2017 Fourth International Conference on Signal Processing, Communication and Networking (ICSCN)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSCN.2017.8085677\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 Fourth International Conference on Signal Processing, Communication and Networking (ICSCN)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSCN.2017.8085677","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Low leakage circuit design using bootstrap technique
Leakage power dissipation is drastically increasing with the scaling of the each new technology node. The number of gates per chip has increased for improving the performance of the circuits, rise in operating frequency and many more has resulted in greater leakage power dissipation. That demands low power integrated circuits (ICs). In this paper, bootstrapping technique has been used so as to overcome the leakage power dissipation. 4:1 multiplexer is designed by using bootstrapping technique at 32nm technology node and the results are obtained using Silvaco's tools. The leakage power result obtained had been taken at different voltages (1V, 0.8V, 0.6V, 0.4V) for checking the effect of voltage scaling.