{"title":"典型聚合物的总电子发射产率","authors":"Yu Chen, Jiang Wu, M. Cho, K. Toyoda","doi":"10.1109/ICSD.2013.6619757","DOIUrl":null,"url":null,"abstract":"In this paper, a pulsed scanning method for the total electron emission yield measurement of insulating materials is proposed. A total electron detector with big hollow space and insulating spacer, and a pulsed yield scanning measurement system is recommended. This method can avoid influence from the charged surface of the insulating material. Using the system, the total secondary electron emission yields of several typical polymers, such as, PA, PS, PI, PTFE, HDPE, PC, PMMA, PEEK, PET, UHMW-PE, have been reported, as induced by a 30 microsecond pulse of primary electrons with ~ 20 nA incident beam current and energies up to 2500 eV.","PeriodicalId":437475,"journal":{"name":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"3","resultStr":"{\"title\":\"Total electron emission yields of typical polymers\",\"authors\":\"Yu Chen, Jiang Wu, M. Cho, K. Toyoda\",\"doi\":\"10.1109/ICSD.2013.6619757\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"In this paper, a pulsed scanning method for the total electron emission yield measurement of insulating materials is proposed. A total electron detector with big hollow space and insulating spacer, and a pulsed yield scanning measurement system is recommended. This method can avoid influence from the charged surface of the insulating material. Using the system, the total secondary electron emission yields of several typical polymers, such as, PA, PS, PI, PTFE, HDPE, PC, PMMA, PEEK, PET, UHMW-PE, have been reported, as induced by a 30 microsecond pulse of primary electrons with ~ 20 nA incident beam current and energies up to 2500 eV.\",\"PeriodicalId\":437475,\"journal\":{\"name\":\"2013 IEEE International Conference on Solid Dielectrics (ICSD)\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2013-10-08\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"3\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2013 IEEE International Conference on Solid Dielectrics (ICSD)\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ICSD.2013.6619757\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 IEEE International Conference on Solid Dielectrics (ICSD)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICSD.2013.6619757","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
Total electron emission yields of typical polymers
In this paper, a pulsed scanning method for the total electron emission yield measurement of insulating materials is proposed. A total electron detector with big hollow space and insulating spacer, and a pulsed yield scanning measurement system is recommended. This method can avoid influence from the charged surface of the insulating material. Using the system, the total secondary electron emission yields of several typical polymers, such as, PA, PS, PI, PTFE, HDPE, PC, PMMA, PEEK, PET, UHMW-PE, have been reported, as induced by a 30 microsecond pulse of primary electrons with ~ 20 nA incident beam current and energies up to 2500 eV.
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