{"title":"FITVS:基于fpga的高效硬度评估仿真工具","authors":"Hongchao Zheng, L. Fan, S. Yue","doi":"10.1109/ISPA.2008.46","DOIUrl":null,"url":null,"abstract":"This paper presents an improved tool called FITVS (Fault Injection Tool for Validating SEE) using the FPGA-based emulation system for fault grading. A novel library-replace-modeling technique that can quickly and easily perform SEE by injecting faults into the circuit nodes is proposed. It helps IC designers to enhance the quality of their design by providing the sensitivity information of all nodes. Also the fault injection effectiveness is improved with relative to the traditional methods by utilizing C# program and FPGA emulation, and the speed of injection can reach the order of lus/fault.","PeriodicalId":345341,"journal":{"name":"2008 IEEE International Symposium on Parallel and Distributed Processing with Applications","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2008-12-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"15","resultStr":"{\"title\":\"FITVS: A FPGA-Based Emulation Tool For High-Efficiency Hardness Evaluation\",\"authors\":\"Hongchao Zheng, L. Fan, S. Yue\",\"doi\":\"10.1109/ISPA.2008.46\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This paper presents an improved tool called FITVS (Fault Injection Tool for Validating SEE) using the FPGA-based emulation system for fault grading. A novel library-replace-modeling technique that can quickly and easily perform SEE by injecting faults into the circuit nodes is proposed. It helps IC designers to enhance the quality of their design by providing the sensitivity information of all nodes. Also the fault injection effectiveness is improved with relative to the traditional methods by utilizing C# program and FPGA emulation, and the speed of injection can reach the order of lus/fault.\",\"PeriodicalId\":345341,\"journal\":{\"name\":\"2008 IEEE International Symposium on Parallel and Distributed Processing with Applications\",\"volume\":\"1 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"2008-12-10\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"15\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"2008 IEEE International Symposium on Parallel and Distributed Processing with Applications\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/ISPA.2008.46\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"2008 IEEE International Symposium on Parallel and Distributed Processing with Applications","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISPA.2008.46","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
FITVS: A FPGA-Based Emulation Tool For High-Efficiency Hardness Evaluation
This paper presents an improved tool called FITVS (Fault Injection Tool for Validating SEE) using the FPGA-based emulation system for fault grading. A novel library-replace-modeling technique that can quickly and easily perform SEE by injecting faults into the circuit nodes is proposed. It helps IC designers to enhance the quality of their design by providing the sensitivity information of all nodes. Also the fault injection effectiveness is improved with relative to the traditional methods by utilizing C# program and FPGA emulation, and the speed of injection can reach the order of lus/fault.